Securing the Future of Management Education, Competitive Destruction or Constructive Innovation?
Alexander Wilson , Loughborough University
Howard Thomas, Lee Kong Chian School of Business, Singapore Management University, Singapore
Lynne Thomas, Visual Counselling and Coaching, Stratford-on-Avon, UK
Michelle Lee, Lee Kong Chian School of Business, Singapore Management University, Singapore
This is the second of two volumes written to celebrate the 40th anniversary of EFMD. Drawing on interviews conducted with leaders in the world of management education, the first volume took a retrospective view, focusing on the evolution of management education and providing the context that led management education to where it stands today. It also synthesized respondents views on the strengths and weaknesses of the field, the challenges it faces, as well as lessons learned and not learned from the past.
- This is the second of two volumes written to celebrate the 40th anniversary of EFMD.
- Drawing on the very rich data provided by the respondents featured in Volume 1, this work is future-oriented and takes on the theme of change.
- It provides the reader with a sense of the challenges on the horizon, potential blind spots, and new realities of an increasingly competitive environment.
- It discusses a range of alternative future scenarios for management education, and urges the field to resist the lures of the dominant paradigm and to develop new models instead.
- The authors contend that, given the challenges ahead, it is only through transformations and innovations that the future of the field can be secured.
In a rapidly changing world - globalisation, an aging population and constantly mind-boggling technological breakthroughs - the challenges are as much external as internal. The debates about how management education should transform itself will become more heated and insistent. This book examines and confronts all the issues which will emerge in those debates, while offering potential maps for the rough journey in prospect. Read John Wheatcroft's full review....